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Please use this identifier to cite or link to this item: http://dspace.bsu.edu.ru/handle/123456789/1947
Title: Statistics of mesoplasma channel formation upon thermal breakdown stabilization in thin semiconductor films
Authors: Andreyeva, N. V.
Virchenko, Yu. P.
Keywords: science
physics
semiconductors
thermal breakdown
semiconductor films
stabilization
mesoplasma channels
Issue Date: 2006
Citation: Andreyeva, N.V. Statistics of mesoplasma channel formation upon thermal breakdown stabilization in thin semiconductor films / N.V. Andreeva, Yu.P. Virchenko ; BSU // Technical physics letters. - 2006. - Vol.32, №3.-P. 188-190. - doi: 10.1134/S1063785006030023.
Abstract: A phenomenological model of the development of thermal breakdown in semiconductor films is considered, and it is shown that the average number of mesoplasma channels experimentally observed in the regime of thermal breakdown stabilization can substantially vary
URI: http://dspace.bsu.edu.ru/handle/123456789/1947
Appears in Collections:Статьи из периодических изданий и сборников (на иностранных языках) = Articles from periodicals and collections (in foreign languages)

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