| Поле DC | Значение | Язык |
|---|
| dc.contributor.author | Acerbi, F. | - |
| dc.contributor.author | Adhikari, P. | - |
| dc.contributor.author | Ahmad, I. | - |
| dc.contributor.author | Kubankin, A. | - |
| dc.contributor.author | Oleinik, A. | - |
| dc.date.accessioned | 2026-03-24T13:01:02Z | - |
| dc.date.available | 2026-03-24T13:01:02Z | - |
| dc.date.issued | 2025 | - |
| dc.identifier.citation | Quality assurance and quality control of the 26 m² SiPM production for the DarkSide-20k dark matter experiment / F. Acerbi, P. Adhikari, I. Ahmad [et al.] // The European Physical Journal C. - 2025. - Vol.85.-Art. 534. - Doi: 10.1140/epjc/s10052-025-14196-9. | ru |
| dc.identifier.uri | http://dspace.bsuedu.ru/handle/123456789/66387 | - |
| dc.description.abstract | This paper describes the Quality Assurance and Quality Control (QA/QC) plan and procedures accompanying the production of FBK NUV-HD-cryo SiPM wafers manufactured by LFoundry s.r.l. (Avezzano, AQ, Italy) | ru |
| dc.language.iso | en | ru |
| dc.subject | physics | ru |
| dc.subject | particle physics | ru |
| dc.subject | DarkSide-20k | ru |
| dc.subject | silicon photomultipliers | ru |
| dc.subject | dark matter | ru |
| dc.subject | outer veto detectors | ru |
| dc.subject | quality control | ru |
| dc.title | Quality assurance and quality control of the 26 m² SiPM production for the DarkSide-20k dark matter experiment | ru |
| dc.type | Article | ru |
| Располагается в коллекциях: | Статьи из периодических изданий и сборников (на иностранных языках) = Articles from periodicals and collections (in foreign languages)
|
